Modern Lab Experiments

Contents:

• 1. Summary of Error Analysis and Statistical Methods
  • 1.1. Overview
  • 1.2. Accuracy vs Precision
  • 1.3. Notation: Significant Figures and Roundoff
  • 1.4. Types of Errors/Uncertainties
  • 1.5. Estimating Measurement Errors
  • 1.6. Combination of Errors
  • 1.7. Mean, Least Squares
  • 1.8. Least Square Fitting, Parameter Determination
• 2. Collection of useful tools
  • 2.1. Overview
  • 2.2. Calculate a derivative numerically
  • 2.3. Select a sub-set of data interactively
  • 2.4. Fitting a Peak in a Histogram
  • 2.5. Peak Position by Fitting a Parabola
  • 2.6. Fitting a Gaussian
• 3. Absorption of Beta Particles
  • 3.1. Background
  • 3.2. Experiment
  • 3.3. Analysis
• 4. Beta Spectroscopy
  • 4.1. Background
  • 4.2. Experiment
  • 4.3. Analysis
• 5. Black-Body Radiation
  • 5.1. Background
  • 5.2. Experimental Equipment
  • 5.3. Experimental Procedure
  • 5.4. Analysis
• 6. Compton Scattering
  • 6.1. Background
  • 6.2. Experimental Procedure
  • 6.3. Analysis
• 7. Counting Statistics
  • 7.1. Background
  • 7.2. Geometry of a Point Source
  • 7.3. Experiment
  • 7.4. Analysis
  • 7.5. How to create a histogram with a bin-width of 1:
• 8. Electron Diffraction
  • 8.1. Background
  • 8.2. Experimental Setup
  • 8.3. Experimental Procedure
  • 8.4. Analysis
• 9. The e/m Ratio
  • 9.1. Background
  • 9.2. Experimental Procedure
• 10. Electron Spin Resonance
  • 10.1. Background
  • 10.2. Experimental Details
  • 10.3. Experimental Procedure
• 11. The Franck-Hertz Experiment
  • 11.1. Overview
  • 11.2. Experimental Procedure
  • 11.3. Analysis Hint
• 12. Gamma Spectroscopy
  • 12.1. Background
  • 12.2. Experimental Procedure
  • 12.3. Analysis
• 13. Hydrogen Spectrum
  • 13.1. Background
  • 13.2. Experimental Equipment
  • 13.3. Pre-Lab Preparation
  • 13.4. Experimental Procedure
  • 13.5. Analysis
• 14. ImageAnalyzer
  • 14.1. Introduction
  • 14.2. Using the Program
• 15. Two-Slit Interference: Young’s Experiment
  • 15.1. Historical context
  • 15.2. Experimental Setup
  • 15.3. Optical Alignment
  • 15.4. Measurements
  • 15.5. Photodiode Checkout
  • 15.6. Pre-Lab Preparation
  • 15.7. Analysis
  • 15.8. Single and Double Slit Interference Patterns
  • 15.9. Programming Hints:
• 16. Michelson Interferometer
  • 16.1. Background
  • 16.2. Experimental Equipment
  • 16.3. Experimental Procedure
  • 16.4. Analysis
• 17. Lenses and Optical Instruments
  • 17.1. Background
  • 17.2. Raytracing and the Lens Equation
  • 17.3. Lens Combinations: The Lens Doublet
  • 17.4. Focal Length Determinatio Part A
  • 17.5. Focal Length Determinatio Part B
• 18. The Photo-Electric Effect
  • 18.1. Background
  • 18.2. Experimental Equipment
  • 18.3. Pre-Lab Preparation
  • 18.4. Experimental Procedure
  • 18.5. Analysis
• 19. PN-Junction
  • 19.1. Background
  • 19.2. Experimental Procedure
  • 19.3. Analysis
• 20. Rutherford Scattering
  • 20.1. Background Information
  • 20.2. Pre-Lab Preparation
  • 20.3. Experimental Procedure
  • 20.4. Analysis
• 21. Compton Scattering with Scintillation Detector
  • 21.1. Background
  • 21.2. Experimental Setup
  • 21.3. High Energy Photon Detection
  • 21.4. Pre-Lab Preparation
  • 21.5. Experimental Procedure
  • 21.6. Analysis
• 22. Scintillation Detector
  • 22.1. Background
  • 22.2. Photo Multiplier
  • 22.3. Electronics and Data Acquisition
  • 22.4. Detection of Photons
  • 22.5. Experimental Procedure
• 23. The Speed of Light
  • 23.1. Background
  • 23.2. Experimental Equipment
  • 23.3. Pre-Lab Preparation
  • 23.4. Experimental Procedure
  • 23.5. Analysis
• 24. Stefan-Boltzmann Law
  • 24.1. Background
  • 24.2. Experimental Equipment
  • 24.3. Experimental Procedure
  • 24.4. Analysis
• 25. High Temperature Superconductor
  • 25.1. Background
  • 25.2. Procedure
• 26. Transistor Characteristics
  • 26.1. Background
  • 26.2. Experiment
• 27. X-Ray Spectrometer
  • 27.1. Background
  • 27.2. Pre-Lab Preparation
  • 27.3. Experimental Procedure
• 28. Normal Zeeman Effect
  • 28.1. Background
  • 28.2. Experimental Procedure
  • 28.3. Data Analysis

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